MTS-SLT-Series

This is our independent research and development, manufacturing of high performance, high stability, high yield of system-level translation test separator. The JEDEC Tray equipped with IC is placed into the equipment manually. During equipment operation, the IC is absorbed from the Tray and placed into the test base of the equipment for testing by transferring the loading module. This is the test environment at room temperature, high temperature and low temperature. After the test is complete, place the IC on the Tray of OK or NG according to the test result. Finally, remove the Tray manually

Equipment advantages

• 01

  Can support 12 test stations

• 02

  Each site can be tested independently

• 03

  Various active thermal control (ATC) options

• 04

  Good and bad products can be placed in separate BIN

• 05

  A maximum of 16 programmable bins, 1 FAILED and 1 PASSED

• 06

  Quickly replace the temperature control head and accessories

• 07

  Programmable setting of various DUT pin counts

• 08

  2D visual camera detects DUT direction

• 09

  Optional 3D visual camera to detect ball bending or ball damage

• 10

  Anti-static and EMO switch safety design, door sensors, etc.

Basic information

Machine size:2760x1720x2000mm	Contact force:Max 150kg, -/+ 0.2kg
Machine weight:2500KG	UPH:420 units
Number of test stations:X12X24X36X48	Visual detection ability:MarkingLeadBall inspection
Supported chip size:10x10 to 75x75(mm)	Storage quantity:2 input/output tray Track
Test board size:≦260mm x 380mm	Failure rate:<1/3000
Test time:<12second	Data acquisition:Jam rate,UPH,Yield